李建模教授的主要研究興趣在積體電路(尤其是數位部分)之測試及診斷,研究題目包括:內建自我測試,系統晶片測試及診斷,缺陷導向測試,錯誤診斷等等。
Professor Li’s research focuses on VLSI testing and diagnosis, especially for digital circuits. Specifically, Professor Li is working on these topics: Built-In Self Test (BIST), System-on-Chip (SoC) Testing and Diagnosis, Defect Based Testing, Fault Diagnosis.