李建模 Chien-Mo (James) Li
國立台灣大學電機工程學系 教授
Professor, Department of Electrical Engineering, National Taiwan University
主要研究領域:
積體電路測試及診斷Major Research Areas:
VLSI Testing and Diagnosis研究領域摘要:
李建模教授的主要研究興趣在積體電路(尤其是數位部分)之測試及診斷，研究題目包括：內建自我測試，系統晶片測試及診斷，缺陷導向測試，錯誤診斷等等。
Research Summary:
Professor Li’s research focuses on VLSI testing and diagnosis, especially for digital circuits. Specifically, Professor Li is working on these topics: Built-In Self Test (BIST), System-on-Chip (SoC) Testing and Diagnosis, Defect Based Testing, Fault Diagnosis.
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B.S.
National Taiwan University, 1993 -
M.S.
Stanford University, 1997 -
Ph.D.
Stanford University, 2002
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Address
EE2-339,
Department of Electrical Engineering,
National Taiwan University,
Taipei 106, Taiwan -
Phone
+886-2-33663639 -
FAX
+886-2-23687664 -
Email:
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Office Hour
Mon. 15:00-17:00 -
Personal Homepage
http://cc.ee.ntu.edu.tw/~cmli -
Lab. Homepage:
代表性著作 Selected Publication
- Y. Huang, R Guo, W.T. Cheng, and J. C.-M. Li,, “Survey of Scan Chain Diagnosis,” IEEE Design & Test of Computers,, Vol. 25, NO. 3, pp.240-248,, 2008
- W.S. Chuang, James C.-M. Li, “Diagnosis of Multiple Scan Chain Timing Faults,” IEEE Trans. Computer-aided Design of IC and Syst., Vol. 27, No.6, pp.1104-1116, 2008
- J. C.-M. Li, Hung-Mao Lin and Fang Min Wang, “Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis,” IEEE Trans. Computers, Vol56, NO3, 402-414, Mar. 2007
- Wang, Wu, Wen and et. al., “VLSI Test Principles and Architectures,” Morgan Kaufmann, USA, 800 pages, 2006
- H.M. Lin and J. C. M. Li, “Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains,” Proc. IEEE Int’l Test Conf., paper 42.3, Oct. 2005