The research areas include (1) VLSI Self-Testing and Fault-Tolerance, (2) High-Speed I/O Testing, and (3) Power-Safe Testing.
Current research topics are
1. ADC/DAC design-for-test and built-in-self-test
2. ADC/DAC external digital calibration
3. Jitter tolerance testing
4. Jitter extraction and decomposition
5. Low power test pattern generation and compression
6. Design for low test power